By Topic

The use of artificial immune system algorithms in monitoring industrial

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Abdelhadi, A. ; Dept. of Comput. Sci., Univ. of Khenchela, Khenchela, Algeria ; Mouss, L.H.

We describe in this paper an overview of artificial immune system algorithms to solve the classification problem in industrial monitoring. We present artificial immune system algorithms, starting with the negative selection that happens to be a rich source of inspiration. We also, detail the clonal selection algorithm, which is based on the clonal selection theory. Finally, we detail other algorithms based of agent including the immune system and dendritic cell algorithm. In the end, we summarize the differences and similarities of the works discussed and we conclude on the prospects related to the approach of the algorithms of artificial immune systems for industrial monitoring to solve the classification problem.

Published in:

Sciences of Electronics, Technologies of Information and Telecommunications (SETIT), 2012 6th International Conference on

Date of Conference:

21-24 March 2012