By Topic

Nonuniform image patch exemplars for low level vision

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
De Smet, V. ; ESAT-PSI/iMinds, KU Leuven, Leuven, Belgium ; Namboodiri, V.P. ; Van Gool, L.

In this paper we propose the use of nonuniformly resized image patch exemplars for solving low level vision problems like denoising and super-resolution. While patch-based methods have been shown to be successful for several such applications, these methods have so far assumed uniform sizes for image patches. In this paper we address this restriction. We use an integral image representation for efficient computation of the matching cost for variable-sized patches. We show that nonuniform image patch exemplars are useful in improving classic techniques for nonlocal means-based denoising and example-based superresolution. We provide refinement cues to further improve the patch size estimation. This method can be adopted for a large number of related methods and applications due to its simplicity and generality.

Published in:

Applications of Computer Vision (WACV), 2013 IEEE Workshop on

Date of Conference:

15-17 Jan. 2013