Cart (Loading....) | Create Account
Close category search window

Noise characterization of depth sensors for surface inspections

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

In the context of environment reconstruction for inspection, it is important to handle sensor noise properly to avoid distorted representations. A short survey of available sensors is realize to help their selection based on the payload capability of a robot. We then propose uncertainty models based on empirical results for three models of laser rangefinders: Hokuyo URG-04LX, UTM-30LX and the Sick LMS-151. The methodology, used to characterize those sensors, targets more specifically different metallic materials which often give distorted images due to reflexion. We also evaluate the impact of sensor noise on surface normal vector reconstruction and conclude with observations about the impact of sunlight and reflexions.

Published in:

Applied Robotics for the Power Industry (CARPI), 2012 2nd International Conference on

Date of Conference:

11-13 Sept. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.