By Topic

Partial scan selection based on dynamic reachability and observability information

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
M. S. Hsiao ; Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA ; G. S. Saund ; E. M. Rudnick ; J. H. Patel

A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-detect faults are easily detected. This is done by taking advantage of the information available when a target fault is aborted by the test generator. A partial scan selection tool, IDROPS, has been developed which selects the best and smallest set of flip-flops to scan that will result in a high fault coverage. Results indicate that high fault coverage in hard-to-test circuits can be achieved using fewer scan flip-flops than in previous methods

Published in:

VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on

Date of Conference:

4-7 Jan 1998