Cart (Loading....) | Create Account
Close category search window

Selecting Materialized Views Based on Top-k Query Algorithm for Lineage Tracing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jiyun Li ; Sch. of Comput. Sci. & Technol., Donghua Univ., Shanghai, China ; Xin Li ; Juntao Lv

Lineage tracing queries help to locate updated views quickly in data warehouse. Materialized views can improve the efficiency of the data lineage tracing and view maintenance. This paper, a method to select materialized views using Top-k query algorithm is presented. The selection is based on the query frequency, the view storage space and maintenance cost. Experimental results show that Top-k query algorithm has a better query performance than the Heuristic algorithm for lineage tracing query.

Published in:

Intelligent Systems (GCIS), 2012 Third Global Congress on

Date of Conference:

6-8 Nov. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.