By Topic

Fast scanning in AFM using non-raster sampling and time-optimal trajectories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Peng Huang ; Department of Mechanical Engineering, Boston University, MA 02215, USA ; Sean B. Andersson

Standard approaches to high-speed AFM rely on moving the tip faster along the raster-scan pattern. Recent work has developed a non-raster scheme for string-like samples such as biopolymers that reduces imaging time by reducing the total number of measurements. This local raster-scan algorithm steers the tip in a sinusoidal path along the sample, acquiring only data near the sample of interest. It has been shown that for a particular class of samples, an order-of-magnitude reduction in imaging time is possible. In this paper we build upon that approach but consider time-lapse imaging. In this scenario, the prior knowledge from previous images can be used to setup a time-optimal control problem between successive crossing points along the string-like sample. Using recent results in time-optimal control, we solve this problem and illustrate that it can, in principle at least, yield at least an additional order of magnitude improvement in the imaging rate.

Published in:

2012 IEEE 51st IEEE Conference on Decision and Control (CDC)

Date of Conference:

10-13 Dec. 2012