By Topic

Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Costas Argyrides ; Research Division, EVOLVI.T., Limassol, Cyprus ; Pedro Reviriego ; Juan Antonio Maestro

Different techniques have been used to deal with defects and soft errors. Repair techniques are commonly used for defects, while error correction codes are used for soft errors. Recently, some proposals have been made to use error correction codes to deal with defects. In this paper, we analyze the impact on reliability of such approaches that use error correction codes, which in addition to soft errors can resolve defects, at the cost of reduced ability to correct soft errors. The results showed that low defect rates or small memory sizes are required to have a low impact on reliability. Additionally, a technique that can improve reliability is proposed and analyzed. The results show that our new approach can achieve a similar reliability in terms of time to failure as that of a defect free memory at the cost of a more complex decoding algorithm.

Published in:

IEEE Transactions on Reliability  (Volume:62 ,  Issue: 1 )