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Formal Methods for Early Analysis of Functional Reliability in Component-Based Embedded Applications

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5 Author(s)
Hazra, A. ; Dept. of Comput. Sci. & Eng., IIT Kharagpur, Kharagpur, India ; Ghosh, P. ; Vadlamudi, S.G. ; Chakrabarti, P.P.
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We present formal methods for determining whether a set of components with given reliability certificates for specific functional properties are adequate to guarantee desired end-to-end properties with specified reliability requirements. We introduce a formal notion for the reliability gap in component-based designs and demonstrate the proposed approach for analyzing this gap using a case study developed around an Elevator Control System.

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Embedded Systems Letters, IEEE  (Volume:5 ,  Issue: 1 )