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This paper presents a time-to-digital converter (TDC) architecture capable of reaching high-precision and high-linearity with moderate area occupation per measurement channel. The architecture is based on a coarse counter and a couple of two-stage interpolators that exploit the cyclic sliding scale technique in order to improve the conversion linearity. The interpolators are based on a new coarse-fine synchronization circuit and a new single-stage Vernier delay loop fine interpolation. In a standard cost-effective 0.35 μm CMOS technology the TDC reaches a dynamic range of 160 ns, 17.2 ps precision and differential non-linearity better than 0.9% LSB rms. The TDC building block was designed in order to be easily assembled in a multi-channel monolithic TDC chip. Coupled with a SPAD photodetector it is aimed for TCSPC applications (like FLIM, FCS, FRET) and direct ToF 3-D ranging.