Cart (Loading....) | Create Account
Close category search window
 

Knowledge-Aided Adaptive Subspace Detection in Partially Homogeneous Environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Hongsen Xie ; Navig. Eng. Dept., Naval Aeronaut. Eng. Inst., Qingdao, China ; Peng Zhou ; Baokuan Luan ; Weijun Chen
more authors

In this paper, we consider an adaptive subspace detector for partially homogeneous environments. In this environment, the clutter covariance matrix (CCM) of secondary data is equal to the CCM of the cell under test (CUT), except for a real constant factor. We also suppose that we have some prior knowledge of the CCM, and the prior knowledge is controlled by the parameters of the statistical distribution of the CCM. Based on the Bayesian framework, a knowledge-aided adaptive subspace detector (KA-ASD) is given, which can be used to detect the subspace signal in partially environments. Computer simulation is used to validate that KA-ASD outperforms the conventional subspace detector, especially in situations with a small number of secondary data.

Published in:

Computer Science & Service System (CSSS), 2012 International Conference on

Date of Conference:

11-13 Aug. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.