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“Covering”: How We Missed the Inside-Story of the VLSI Revolution

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1 Author(s)
Ken Shepard ; Columbia University, New York USA

I'm delighted to comment on Lynn Conway's outstanding piece “Reminiscences of the VLSI Revolution: How a series of failures triggered a paradigm shift in digital design.” What we often forget in engineering and science is that innovation and technological progress happen because of actions of people, people who have personalities, lives, and life stories that influence them and are influenced by those around them. Lynn's story provides a case in point.

Published in:

IEEE Solid-State Circuits Magazine  (Volume:4 ,  Issue: 4 )