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Multiple fault diagnosis with BDD based boolean differential equations

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4 Author(s)
Ubar, R. ; TTU, Tallinn, Estonia ; Raik, J. ; Kostin, S. ; Kousaar, J.

We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.

Published in:

Electronics Conference (BEC), 2012 13th Biennial Baltic

Date of Conference:

3-5 Oct. 2012