Close category search window
 

Runout Tracking in Electric Motors Using Self-Mixing Interferometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Atashkhooei, R. ; R. Atashkhooei is with the Center for Sensors, Instruments, and Systems Development (CD6 Research Center), Universitat Politecnica de Catalunya, Terrassa 08222, Barcelona, Spain (e-mail: reza.atashkhooei@cd6.upc.edu). ; Urresty, J.-C. ; Royo, S. ; Riba, J.-R.
more authors

In this paper, a self-mixing interferometry sensor has been used as a proximity probe to measure possible runout in permanent magnet synchronous motors, for fault diagnosis. A general procedure for the measurement of the 2-D trajectory of the motor shaft is described in detail, including procedures for the characterization of the uncertainty due to the shape of the shaft, and the management of speckle noise. The performance of the proposed sensor has been compared to that of a commercial Polytec laser vibrometer, for validation purposes. Results show inaccuracies in the order of $pm$6 $mu$m, which agree well with the measured uncertainty introduced by shaft surface imperfections.

Published in:
Mechatronics, IEEE/ASME Transactions on  (Volume:PP ,  Issue: 99 )

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.