By Topic

Use of a CMOS Image Sensor for an Active Personal Dosimeter in Interventional Radiology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

16 Author(s)
Conti, E. ; Univ. of Perugia, Perugia, Italy ; Placidi, P. ; Biasini, M. ; Bissi, L.
more authors

Interventional radiologists and staff members, during all their professional activities, are frequently exposed to protracted and fractionated low doses of ionizing radiation. Due to skin tissues and peripheral blood irradiation, these exposures can result in deterministic effects (radiodermatitis, aged skin, and hand depilation) or stochastic ones (skin and non-solid cancer incidence). The authors present a novel approach to perform online monitoring of the staff during their interventions by using a device based on an Active Pixel Sensor. The performance of the sensor as an X-ray radiation detector has been evaluated with a proper experimental setup: the number of photons and the generated charge have been assessed as dosimetric observables from the frames acquired by the sensor using a two-threshold clustering algorithm, the efficiency of which has been evaluated as well. The correlation of these observables with passive dosimeter dose measurements has been analyzed: a good linearity has been demonstrated, and the response difference between pulsed and continuous operational modes is reduced to less than 10%, marking a distinct improvement with respect to commercial Active Personal Dosimeters.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:62 ,  Issue: 5 )