Referenced Items are not available for this document.
This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
Published in:
Radiation Effects Data Workshop (REDW), 2012 IEEE
Date of Conference: 16-20 July 2012
- Page(s):
- 1 - 10
- ISSN :
- 2154-0519
- Print ISBN:
- 978-1-4673-2730-5
- INSPEC Accession Number:
- 13135947
- Conference Location :
- Tucson, AZ
- Digital Object Identifier :
- 10.1109/REDW.2012.6353747
- Product Type:
- Conference Publications
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