Referenced Items are not available for this document.
Test results are presented for a number of electronic devices evaluated for sensitivity to non-ionizing displacement damage dose and low dose rate total ionizing dose for space applications at Ball Aerospace & Technologies Corp.
Published in:
Radiation Effects Data Workshop (REDW), 2012 IEEE
Date of Conference: 16-20 July 2012
- Page(s):
- 1 - 6
- ISSN :
- 2154-0519
- Print ISBN:
- 978-1-4673-2730-5
- INSPEC Accession Number:
- 13135944
- Conference Location :
- Tucson, AZ
- Digital Object Identifier :
- 10.1109/REDW.2012.6353743
- Product Type:
- Conference Publications
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