By Topic

Radiation Test Results on COTS and Non-COTS Electronic Devices for NASA Johnson Space Center Spaceflight Projects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

This paper reports the results of recent proton Single Event Effect (SEE) testing on a variety of COTS and non-COTs electronic devices and assemblies tested for the International Space Station (ISS) and other spaceflight programs.

Published in:

Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference:

16-20 July 2012