By Topic

"PICO-4" Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Egorov, A.N. ; Specialized Electron. Syst., Moscow, Russia ; Chumakov, A.I. ; Mavritskiy, O.B. ; Pechenkin, A.A.
more authors

Technical characteristics of "PICO-4" SEE simulation facility utilizing a tunable picosecond laser source are presented. Its capabilities aimed on simulation of single event effects under space environment in Si, GaAs, SiGe etc. microelectronic devices are discussed.

Published in:

Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference:

16-20 July 2012