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"PICO-4" Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser

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6 Author(s)
Egorov, A.N. ; Specialized Electron. Syst., Moscow, Russia ; Chumakov, A.I. ; Mavritskiy, O.B. ; Pechenkin, A.A.
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Technical characteristics of "PICO-4" SEE simulation facility utilizing a tunable picosecond laser source are presented. Its capabilities aimed on simulation of single event effects under space environment in Si, GaAs, SiGe etc. microelectronic devices are discussed.

Published in:
Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference: 16-20 July 2012

Page(s):
1 - 4
ISSN :
2154-0519
Print ISBN:
978-1-4673-2730-5
INSPEC Accession Number:
13135932
Conference Location :
Tucson, AZ
Digital Object Identifier :
10.1109/REDW.2012.6353726
Product Type:
Conference Publications

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