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Equipment and Test Results of the Electronic Components to SEE in the Temperature Range

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9 Author(s)
Anashin, V.S. ; JSC Inst. of Space Device Eng., Moscow, Russia ; Kozyukov, A.E. ; Emeliyanov, V.V. ; Ozerov, A.I.
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This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility.

Published in:

Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference:

16-20 July 2012