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The work presented here discusses two test methodologies for total ionising dose radiation testing of electronic components and ways in which common practice can be improved. Emphasis is given to modern, fully automated test solutions, using in-situ measurement methods. Results from pilot, proof-of-concept, experimental in-situ tests are also presented in this paper. These show that the in-situ method offers considerable advantages in terms of data fidelity and a much clearer understanding of the effects of radiation on the devices being tested.