Referenced Items are not available for this document.
SEE sensitivity to protons and heavy ions is observed with several types of DDR3 SDRAMs. Upsets in control sections with various error output patterns have been measured along with upsets in memory storage elements.
Published in:
Radiation Effects Data Workshop (REDW), 2012 IEEE
Date of Conference: 16-20 July 2012
- Page(s):
- 1 - 8
- ISSN :
- 2154-0519
- Print ISBN:
- 978-1-4673-2730-5
- INSPEC Accession Number:
- 13135927
- Conference Location :
- Tucson, AZ
- Digital Object Identifier :
- 10.1109/REDW.2012.6353721
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
