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1 Author(s)
Jeff Guerrieri ; National Institute of Standards and Technology (NIST), USA

The application of RFID encompasses a variety of advancing technologies and is continuously evolving. This special topic section on RFID presents a sample of interference issues, and the metrology to improve test methods and procedures necessary to support this evolving technology.

Published in:

IEEE Electromagnetic Compatibility Magazine  (Volume:1 ,  Issue: 3 )