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Browse Journals & Magazines > Magnetics, IEEE Transactions ...> Volume:48 Issue:11 Help

Annealing Temperature and Co Layer Thickness Dependence of Magnetoresistance Effect for L1_{0} -MnGa/Co/MgO/CoFeB Perpendicular Magnetic Tunnel Junctions

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8 Author(s)
Ma, Q.L. ; WPI Adv. Inst. for Mater. Res., Tohoku Univ., Sendai, Japan ; Kubota, T. ; Mizukami, S. ; Zhang, X.M.
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The post annealing temperature and Co thickness dependence of tunnel magnetoresistance (TMR) ratio was investigated for L10-MnGa/Co(tCo)/MgO/CoFeB perpendicular magnetic tunnel junctions (MTJs). The MnGa/MgO interface optimization by Co insertion was shown to be an effective way for improving the TMR ratio. The TMR value increases with the annealing temperature (Ta), and exhibits maxima at 325 °C for tCo = 1.0 - 5.0 nm. Thermal annealing process improves the structure of MTJs, but also causes elements diffusion. In this work, the annealing effect on MTJs with different Co thicknesses was discussed in detail along with a fast annealing method.

Published in:
Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )

Date of Publication: Nov. 2012

Page(s):
2808 - 2811
ISSN :
0018-9464
INSPEC Accession Number:
13056710
Digital Object Identifier :
10.1109/TMAG.2012.2196420
Product Type:
Journals & Magazines
Date of Current Version :
18 October 2012
Issue Date :
Nov. 2012
Sponsored by :
IEEE Magnetics Society

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