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Browse Journals & Magazines > Magnetics, IEEE Transactions ...> Volume:48 Issue:11 Help

Intergranular Exchange Coupling in FePt:X:FePt ( {\rm X}={\rm B} , C, {\rm SiO}_{\rm x} , Cr and {\rm TaO}_{\rm x} ) Thin Films for Heat Assisted Magnetic Recording

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2 Author(s)
Granz, S.D. ; Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA ; Kryder, M.H.

In this study we quantitatively determined the exchange coupling across B, C, SiOx, Cr and TaOx segregants by measuring the exchange coupling between two FePt layers separated by segregant layers of varying thickness. Our study indicates that the segregant that provides the best exchange break is TaOx; whereas, C is the worst and SiOx, Cr and B are in between. Our data indicates that a segregant intergranular region thicker than 0.8 nm should decouple FePt grains if B, TaOx, SiOx, or Cr are used, but with C, a thickness greater than 1 nm is required.

Published in:
Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )

Date of Publication: Nov. 2012

Page(s):
2746 - 2748
ISSN :
0018-9464
INSPEC Accession Number:
13056588
Digital Object Identifier :
10.1109/TMAG.2012.2194698
Product Type:
Journals & Magazines
Date of Current Version :
18 October 2012
Issue Date :
Nov. 2012
Sponsored by :
IEEE Magnetics Society

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