Cart (Loading....) | Create Account
Close category search window
 

Estimation of NAND Flash Memory Threshold Voltage Distribution for Optimum Soft-Decision Error Correction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dong-hwan Lee ; Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea ; Wonyong Sung

As the feature size of NAND flash memory decreases, the threshold voltage signal becomes less reliable, and its distribution varies significantly with the number of program-erase (PE) cycles and the data retention time. We have developed parameter estimation algorithms to find the means and variances of the threshold voltage distribution that is modeled as a Gaussian mixture. The proposed methods find the best-fit parameters by minimizing the squared Euclidean distance between the measured threshold voltage values and those obtained from the Gaussian mixture model. For the parameter estimation, the gradient descent (GD) and the Levenberg-Marquardt (LM) based methods are employed. The developed algorithms are applied to both simulated and real NAND flash memory. It is also demonstrated that error correction with the estimated mean and variance values yields much better performance when compared to the method that only updates the mean.

Published in:

Signal Processing, IEEE Transactions on  (Volume:61 ,  Issue: 2 )

Date of Publication:

Jan.15, 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.