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A Portable High-Resolution Surface Measurement Device

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3 Author(s)
Ihlefeld, C.M. ; Kennedy Space Center, Nat. Aeronaut. & Space Adm., Merritt Island, FL, USA ; Burns, B.M. ; Youngquist, R.C.

A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:62 ,  Issue: 1 )

Date of Publication:

Jan. 2013

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