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Pulse-shape models are presented that furnish the tools for analyzing a number of aspects of the performance of microelectronic circuits. Model pulse shapes are provided and their properties are analyzed in detail. Applications that are covered include the replication of measured pulses that are of relevance for inter- and intra-chip interconnects and, concurrently, examples of passive circuits that generate them. The pulses are appropriate as input to time-domain electromagnetic simulation. They are also instrumental to microelectronic performance prediction protocols and measurement equipment-aspects that are of crucial importance to integrated circuit packaging.