Cart (Loading....) | Create Account
Close category search window
 

Template-dependent nucleation of metallic droplets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nothern, Denis M. ; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 ; Millunchick, Joanna M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.4754563 

We experimentally investigate the nucleation behavior of metallic gallium droplets deposited on gallium arsenide substrates and calculate the critical cluster size for various growth conditions and substrate templating. We find that the critical cluster size for liquid Ga on GaAs is approximately six atoms. Deposition on substrates templated with arrays of holes does not result in significant ordering of the droplets at the array dimensions studied here, but does result in an apparent reduction of the critical cluster size due to heterogeneous nucleation.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:30 ,  Issue: 6 )

Date of Publication:

Nov 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.