Referenced Items are not available for this document.
This paper presents the results of a SEE neutron evaluation carried out on five SRAM types. Sensitivity to the power supply, test pattern and memory cell structures were investigated
Published in:
Radiation Effects Data Workshop, 1997 IEEE
Date of Conference: 24 Jul 1997
- Page(s):
- 61 - 66
- Print ISBN:
- 0-7803-4061-2
- INSPEC Accession Number:
- 5842434
- Conference Location :
- Snowmass Village, CO
- Digital Object Identifier :
- 10.1109/REDW.1997.629799
- Product Type:
- Conference Publications
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