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Neutron single event effect test results for various SRAM memories

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4 Author(s)
D. Thouvenot ; Nucletudes, Les Ulis, France ; P. Trochet ; R. Gaillard ; F. Desnoyers

This paper presents the results of a SEE neutron evaluation carried out on five SRAM types. Sensitivity to the power supply, test pattern and memory cell structures were investigated

Published in:

Radiation Effects Data Workshop, 1997 IEEE

Date of Conference:

24 Jul 1997