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Investigation of non-independent single event upsets in the TAOS GVSC static RAM

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5 Author(s)
Hosken, R. ; Aerosp. Corp., El Segundo, CA, USA ; Koga, R. ; Wilson, B. ; Marcelli, J.
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Operation of the two TAOS Honeywell GVSC Flight Computers has been monitored over three years. SEUs in the Micron 32K×8 static RAM chips were characterized and some were found to have a common primary event

Published in:

Radiation Effects Data Workshop, 1997 IEEE

Date of Conference:

24 Jul 1997