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Scaling of MOS Technology to Submicrometer Feature Sizes

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6 Author(s)
Liu, S. ; Kramer, J. ; Indiveri, G. ; Delbrück, T.
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This chapter contains sections titled: Scaling Approach, Threshold Scaling, Device Characteristics, System Properties, Conclusions

Book Title :
Analog VLSI:Circuits and Principles
Publisher :
MIT Press
Edition :
1
Pages :
385 - 406
Copyright Year :
2002
ISBN :
9780262256568
Product Type :
MITP Books & eBooks

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