Referenced Items are not available for this document.
This paper describes the use of sensing schemes that drive on-chip process and aging variation measurements in manufactured silicon.
Published in:
Design & Test of Computers, IEEE
(Volume:29
,
Issue:
5
)
Date of Publication: Oct. 2012
- Page(s):
- 8 - 17
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 13250683
- Digital Object Identifier :
- 10.1109/MDT.2012.2211561
- Date of Publication :
- 13 August 2012
- Date of Current Version :
- 21 January 2013
- Issue Date :
- Oct. 2012
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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