By Topic

Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Min Chen ; Texas Instrum., Dallas, TX, USA ; Reddy, V. ; Krishnan, S. ; Srinivasan, V.
more authors

Asymmetric aging under different workload profiles requires on-chip aging sensors to be sensitive to signal edge degradation. The authors in this paper present a 45-nm on-chip aging sensor that directly monitors circuit performance degradation during dynamic operation.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 5 )