Cart (Loading....) | Create Account
Close category search window
 

Calibration of Ultrawide Fisheye Lens Cameras by Eigenvalue Minimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kanatani, K. ; Dept. of Comput. Sci., Okayama Univ., Okayama, Japan

We present a new technique for calibrating ultrawide fisheye lens cameras by imposing the constraint that collinear points be rectified to be collinear, parallel lines to be parallel, and orthogonal lines to be orthogonal. Exploiting the fact that line fitting reduces to an eigenvalue problem in 3D, we do a rigorous perturbation analysis to obtain a practical calibration procedure. Doing experiments, we point out that spurious solutions exist if collinearity and parallelism alone are imposed. Our technique has many desirable properties. For example, no metric information is required about the reference pattern or the camera position, and separate stripe patterns can be displayed on a video screen to generate a virtual grid, eliminating the grid point extraction processing.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:35 ,  Issue: 4 )

Date of Publication:

April 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.