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Various materials for shielding against electromagnetic radiation have been rapidly developed to protect the operational environment and prevent interference. Reliable measurement is required to determine and evaluate the material properties. In this paper, the characterization methods for planar material sample fixtures are first presented in both the time domain using oscilloscope time domain reflectometry (TDR) and vector network analyser TDR methods, and the frequency domain using a vector network analyser (VNA). Then the application of the characterised planar material sample fixtures are described for the measurement of EMI shielding effectiveness of carbon nanotubes based coatings.