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Impact of the Variability of the Process Parameters on CNT-Based Nanointerconnects Performances: A Comparison Between SWCNTs Bundles and MWCNT

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2 Author(s)
Lamberti, P. ; Dept. of Electron. & Comput. Eng., Univ. of Salerno, Fisciano, Italy ; Tucci, V.

A reliable estimation of the performances of two possible realizations of a CNT-based nano-interconnect, namely one obtained by using a bundle of SWCNT and another one employing an MWCNT, taking into account the variations of some physical and geometrical characteristics is carried out. The ranges of the per unit length parameters of a transmission line modeling the interconnect and those of the propagation time delay are analyzed for three different technologies (15, 21, and 32 nm) by means of interval analysis. This approach provides, at once, a worst case analysis and a sound assessment of the robustness and accuracy of the considered performance as a function of the interconnect length. A comparison of the two technological alternatives is carried out in a more consistent way than that usually achieved by considering the nominal behavior.

Published in:

Nanotechnology, IEEE Transactions on  (Volume:11 ,  Issue: 5 )

Date of Publication:

Sept. 2012

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