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ADC test development tool kit

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4 Author(s)
Liggiero, R. ; LTX-Credence, Norwood, MA, USA ; Donovan, K. ; Max, S.M. ; Tilden, S.

A new meaning to “Signature Analysis” as it relates to Analog to Digital Converters (ADCs) and releasing products to production is presented. This paper will expand the reader's skill set with advanced techniques to analyze data from ADCs that justifies device performance. The technique will also be a valuable tool to develop intellectual property that enhances an ADC product line performance. The concepts and calculations will benefit test engineers.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International

Date of Conference:

13-16 May 2012