Cart (Loading....) | Create Account
Close category search window
 

ADC test development tool kit

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Liggiero, R. ; LTX-Credence, Norwood, MA, USA ; Donovan, K. ; Max, S.M. ; Tilden, S.

A new meaning to “Signature Analysis” as it relates to Analog to Digital Converters (ADCs) and releasing products to production is presented. This paper will expand the reader's skill set with advanced techniques to analyze data from ADCs that justifies device performance. The technique will also be a valuable tool to develop intellectual property that enhances an ADC product line performance. The concepts and calculations will benefit test engineers.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International

Date of Conference:

13-16 May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.