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Adaptive Alternate Analog Test

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2 Author(s)
Haralampos-G. Stratigopoulos ; TIMA Laboratory (CNRS-Grenoble INP-UJF), Grenoble, France ; Salvador Mir

Adaptive test is a promising approach for test cost reduction. This article presents an adaptive test scheme for analog circuits that capitalizes on alternate test to achieve a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified and further action is taken.

Published in:

IEEE Design & Test of Computers  (Volume:29 ,  Issue: 4 )