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An open notation for memory tests

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2 Author(s)
Offerman, A. ; Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands ; van de Goor, A.J.

Historically many ways of expressing memory tests have been used, varying from the use of general purpose programming languages to special notations. A notation, originally introduced for march tests in 1990, has been adopted and extended by many researchers. This paper extends that notation, in a systematic and open way, to a memory test language which allows march tests, pseudo march tests, tests involving topological neighborhoods (to cover pattern sensitive faults), line mode tests, and pseudo random tests, to be expressed in a unified manner. The syntax and semantics facilitate the specification of memory tests in a compact and readable way. Most important, the open structure allows extensions to the notation when necessary. The notation presented in this paper is a sequel to an earlier much more confined notation

Published in:

Memory Technology, Design and Testing, 1997. Proceedings., International Workshop on

Date of Conference:

11-12 Aug 1997