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Analysis of Various Types of SEU Data

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1 Author(s)

This chapter contains sections titled:
Critical Charge
Depth and Critical Charge
Charge Collection Mechanisms
Charge Collection and the Cross-Section Curve
Efficacy (Variation of SEU Sensitivity within a Cell)
Mixed-Mode Simulations
Parametric Studies of Device Sensitivity
Influence of Ion Species and Energy
Device Geometry and the Limiting Cross Section
Track Size Effects
Cross-Section Curves and the Charge Collection Processes
Single Event Multiple-Bit Upset
SEU in Logic Systems
Transient Pulses