IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Intelligent Sensors, Sensor N ... Help

Metamaterial-based strain sensors

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jining Li ; Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA, Australia ; Withayachumnankul, W. ; Shengjiang Chang ; Abbott, D.

In this paper, two metamaterial-based strain sensors at terahertz frequencies are introduced and simulated using CST Microwave Studio. They exhibit a large shift in the resonance frequency upon stretching or compression. They are very well suitable to monitoring and detecting mechanical deformation of a target structure remotely.

Published in:
Intelligent Sensors, Sensor Networks and Information Processing (ISSNIP), 2011 Seventh International Conference on

Date of Conference: 6-9 Dec. 2011

Page(s):
30 - 32
Print ISBN:
978-1-4577-0675-2
INSPEC Accession Number:
12541371
Conference Location :
Adelaide, SA
Digital Object Identifier :
10.1109/ISSNIP.2011.6146571
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.