Cart (Loading....) | Create Account
Close category search window
 

Ultra low-power high-speed flexible Probabilistic Adder for Error-Tolerant Applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ning Zhu ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Wang Ling Goh ; Kiat Seng Yeo

In modern VLSI technology, the occurrence of all kinds of errors has become inevitable. The tradeoff between power consumption and speed performance has become a very important concern in circuit design process. It is especially critical when dealing with large data set, whereby the system is degraded in terms of power and speed. By adopting an emerging concept in VLSI design and test, i.e. Error-Tolerance (ET) whereby the correctness is compromised, a large reduction in in power consumption and improvement in speed can be achieved. In this paper, we present a novel low-power and highspeed Probabilistic Adder for Error-Tolerant Applications (ETA) Type III design called ETAIII. The proposed ETAIII is an enhancement of our earlier design, ETAI [1].

Published in:

SoC Design Conference (ISOCC), 2011 International

Date of Conference:

17-18 Nov. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.