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3-D Finite Element Modeling and Validation of Power Frequency Multishielding Effect

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8 Author(s)
Cheng, Z. ; R & D Center, Tianwei Group Co. Ltd., Baoding, China ; Takahashi, N. ; Forghani, B. ; Liu, L.
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The electromagnetic (EM) barrier, the magnetic (M) shunt and a combination of both are widely used in electrical devices in order to control stray fields and effectively reduce the power loss that may lead to hazardous local overheating. This paper focuses on the 3-D finite element modeling and validation of multishielding at power frequencies. The hybrid (M+EM) shielding behavior of the current magnetic shunt configuration is numerically and experimentally examined and is compared to other types. The leakage flux complementary-based measurement method of stray-field loss is also proposed and verified based on the benchmark shielding models.

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Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 2 )