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Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation

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8 Author(s)
Quinteros, C. ; Consejo Nac. de Investig. Cientificas y Tec. (CONICET), Comision de Energia Atomica (CNEA), San Martín, Argentina ; Salomone, L.S. ; Redin, E. ; Rafi, J.M.
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MIS capacitive structures were studied under gamma, 16O and p radiation. The effects observed were registered employing C-V curves. Those showed different characteristics depending on the type of radiation and dielectric.

Published in:
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Date of Conference: 19-23 Sept. 2011

Page(s):
67 - 72
ISSN :
0379-6566
Print ISBN:
978-1-4577-0585-4
INSPEC Accession Number:
12591637
Conference Location :
Sevilla
Digital Object Identifier :
10.1109/RADECS.2011.6131387
Product Type:
Conference Publications

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