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Advanced soft-reliability information-based post-viterbi processor

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2 Author(s)
Jun Lee ; Data and Storage R &D Laboratory, LG Electronics in Korea ; Kees A. Schouhamer Immink

This paper proposes a new soft-reliability information-based post-Viterbi processor with advanced noise-robustness for reducing probability of miss-correction and no correction of a conventional soft-reliability-based post-Viterbi processor. Among all likely error starting positions for prescribed error events, the two schemes are equal to attempt to correct error-type corresponding to a position with minimum one only if there exist positions where a soft-reliability estimate is negative. The main difference between the two schemes is how they acquire the softreliability estimate. The soft-reliability estimate of the new scheme is obtained through the elimination of the noisesensitive component from the log-likelihood ratio of the posteriori probabilities, which is the soft-reliability estimate of conventional scheme. As a result, the new scheme is based on more reliable soft-reliability information so reducing the probability of miss-correction and no correction.

Published in:

IEEE Transactions on Consumer Electronics  (Volume:57 ,  Issue: 4 )