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Multi-cycle Test with Partial Observation on Scan-Based BIST Structure

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4 Author(s)
Yasuo Sato ; Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Iizuka, Japan ; Hisato Yamaguchi ; Makoto Matsuzono ; Seiji Kajihara

Field test for reliability is usually performed with small amount of memory resource, and it requires a new technique which might be somewhat different from the conventional manufacturing tests. This paper proposes a novel technique that improves fault coverage or reduces the number of test vectors that is needed for achieving the given fault coverage on scan-based BIST structure. We evaluate a multi-cycle test method that observes the values of partial flip-flops on a chip during capture-mode. The experimental result shows that the partial observation achieves fault coverage improvement with small hardware overhead than the full observation.

Published in:

2011 Asian Test Symposium

Date of Conference:

20-23 Nov. 2011