Referenced Items are not available for this document.
A characterization setup for high voltage (HV) LD-MOSFET mismatch and variability determination is presented. Devices are aligned in rows and columns for gate and drain bias multiplexing and special HV-switches for voltages up to 50 V are controlled by externally generated digital signals. Automatic DC measurements can be performed on up to 4992 HV-NMOSFETs. The circuit designs of the HV-switches are described in detail and characterization data gained during functionality evaluation are presented. Variability data are provided for both short and long distance matching characterization.
Published in:
Semiconductor Manufacturing, IEEE Transactions on
(Volume:25
,
Issue:
2
)
Date of Publication: May 2012
- Page(s):
- 136 - 144
- ISSN :
- 0894-6507
- INSPEC Accession Number:
- 12695179
- Digital Object Identifier :
- 10.1109/TSM.2011.2181657
- Product Type:
- Journals & Magazines
- Date of Publication :
- 26 December 2011
- Date of Current Version :
- 01 May 2012
- Issue Date :
- May 2012
- Sponsored by :
- IEEE Components, Packaging and Manufacturing Technology Society
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