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The effect of ionizing radiation processes and electron penetration depth on the dielectric properties of a 127μm Teflon FEP sample was investigated by surface potential measurements. We have been able to reveal the presence of a transverse conductivity that is enhanced by radiation ionisation process. The irradiation tests performed as a function of the irradiation energy revealed a strong influence of the electron penetration depth on the intrinsic transverse conductivity: this feature might be assigned to the evolution of traps density with the penetration depth.
Electrets (ISE), 2011 14th International Symposium on
Date of Conference: 28-31 Aug. 2011