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Trapped Flux and Levitation Properties of Multiseeded YBCO Bulks for HTS Magnetic Device Applications—Part II: Practical and Achievable Performance

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11 Author(s)
Zigang Deng ; Lab. of Appl. Phys., Tokyo Univ. of Marine Sci. & Technol. (TUMSAT), Tokyo, Japan ; Izumi, M. ; Miki, M. ; Tsuzuki, K.
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After clarifying the essential characteristics of the multiseeded YBCO bulk in the previous work, that is, the existence of strongly connected or coupled grain boundaries between two grains by means of intergrain super current with a big flowing loop size, this paper proceeds to report its achievable performance in actual excitation conditions by working as trapped-field magnets or levitation devices. Besides evaluation of the trapped-flux characteristics by two most popular excitation methods, namely, static field-cooling magnetization (FCM) and pulsed-field magnetization in liquid nitrogen (LN2), the trapped-flux capability at lower temperatures up to 30 K, an interesting temperature for present superconducting machine applications, is also reported. From LN2 temperature to 30 K, the trapped flux with over six times improvement from 0.64 to 3.91 T was observed by FCM, at the same time along with a much decreased relaxation rate from 13.7% to 0.9% in 1-h measurements. In the aspect of levitation applications, the magnetic force density (both levitation force and guidance force, two most important performance parameters for maglev) above a permanent magnet guideway with Halbach style is measured and found to be able to promote the loading and stability performance of the first high-temperature superconducting maglev test vehicle simultaneously. As the multiseeding technique of the top-seeded melt-growth process has provided a promising way to fabricate bulk superconductors with large size, time saving and cost reduction, the presented trapped-flux and magnetic force results may help to comprehend, refer, and finally make better use of the multiseeded bulks in the large-scale superconducting magnetic devices.

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Applied Superconductivity, IEEE Transactions on  (Volume:22 ,  Issue: 2 )