Cart (Loading....) | Create Account
Close category search window
 

Localization of the inhomogeneity in a two-way line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Prishvin, M. ; Lab. of Appl. Electrodynamics, Tbilisi State Univ., Tbilisi, Georgia ; Kakulia, D. ; Saparishvili, G. ; Kotchlashvili, A.
more authors

The main objective of this paper is the analysis of the two-way line resonance properties, experiencing small variations of distributed parameters along its length. It is shown that the position of such variation can be determined from the AFC of the line. This paper continues the work described in [1]. The application field of described methodology is security intrusion detection systems.

Published in:

Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), 2011 XVth International Seminar/Workshop on

Date of Conference:

26-29 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.